Design of compact-diode-SCR with low-trigger voltage for full-chip ESD protection

Autor:	Yuexin Gao, Xiaowu Cai, Zhengsheng Han, Chuanbin Zeng, Ruirui Xia, Yun Tang, Mali Gao, Bo Li
Rok vydání:	2023
Předmět:	Electrical and Electronic Engineering Safety Risk Reliability and Quality Condensed Matter Physics Atomic and Molecular Physics and Optics Surfaces Coatings and Films Electronic Optical and Magnetic Materials
Zdroj:	Microelectronics Reliability. 140:114860
ISSN:	0026-2714
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::4e9b5931d791a6ad016ce781293aad98 https://doi.org/10.1016/j.microrel.2022.114860 Zobrazit plný text záznamu Full Text from ScienceDirect