A fast moisture sensitivity level qualification method
| Autor: | O. van der Sluis, Xiaosong Ma, Guoqi Zhang, C. Regards, W.D. van Driel, Hélène Fremont, K.M.B. Jansen, L.J. Ernst, Christian Gautier |
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| Rok vydání: | 2010 |
| Předmět: |
Moisture absorption
Materials science Moisture Meteorology Weight change 3d model Soil science Condensed Matter Physics Atomic and Molecular Physics and Optics Surfaces Coatings and Films Electronic Optical and Magnetic Materials Sensitivity test Relative humidity Electrical and Electronic Engineering Safety Risk Reliability and Quality Material properties Saturation (chemistry) |
| Zdroj: | Microelectronics Reliability. 50:1654-1660 |
| ISSN: | 0026-2714 |
| DOI: | 10.1016/j.microrel.2010.07.066 |
| Popis: | In this paper, a fast moisture sensitivity level (MSL) qualification method and a fast moisture characterization method are discussed. The fast moisture characterization uses a stepwise method to obtain more reliable and more material moisture properties. The established relationships for moisture diffusion coefficients and moisture saturation levels with respect to the temperature and relative humidity can be used to predict moisture properties in the MSL range. Fast moisture sensitivity level qualification is accomplished with the aid of simulation combined with the characterized moisture diffusion properties. Moisture absorption processes at different conditions are simulated using a 3D model at conditions according to the moisture sensitivity test levels. Simulation of weight change at different condition and simulation of local moisture concentration are performed and compared between different conditions. Simulations show that at 696 h preconditioning time at 30 °C/60%RH for MSL level 2a can be decreased to 42 h at 85 °C/85%RH. Time required for package reliability and moisture sensitivity analysis is largely shortened. |
| Databáze: | OpenAIRE |
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