Development of a transportable µ-XRF spectrometer with polycapillary half lens

Autor: Shintaro Komatani, Tasuku Yonehara, Atsushi Bando, Sumito Ohzawa, Kazuhiko Nakano, Daisuke Orita, Hiroshi Uchihara, Kouichi Tsuji
Rok vydání: 2010
Předmět:
Zdroj: X-Ray Spectrometry. 39:78-82
ISSN: 1097-4539
0049-8246
DOI: 10.1002/xrs.1226
Popis: We developed a transportable micro-XRF (µ-XRF) spectrometer using a polycapillary X-ray focusing half lens, which was placed between the sample and the detector. The total weight of the developed spectrometer was about 2 kg; its dimensions were 18(W) × 26(D) × 40(H) cm. The spatial resolution of the spectrometer with the half lens of a working (focal) distance of 30 mm was 171 µm at Fe Kα, which was evaluated by a wire scanning method. In this setup, it is easy to replace the polycapillary X-ray half lens with one having a different analytical performance, because a precise position-adjustment of the X-ray lens is not required. The spacial resolution with the half lens of a working distance of 16 mm was 106 µm at Fe Kα. Depending on analyzing area on the sample and required spatial resolution, we can easily change the X-ray lens, as in a conventional optical microscope. The calibration curves of V, Cr, Mn, and Ni measured for standard steel materials showed good linear relationships (correlation coefficients >0.993). Clear elemental mapping could be obtained by scanning the sample (Cu mesh). An elemental analysis of a micro-region in an electronic device was also performed by the transportable µ-XRF spectrometer. Sn and Pb were detected at the metallic part (Sn–Pb solder) of the device. Br and Ba were observed at some resin parts of the electronic device. Copyright © 2009 John Wiley & Sons, Ltd.
Databáze: OpenAIRE
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