Differential Evolution Algorithm With Asymmetric Coding for Solving the Reliability Problem of 3D-TLC CT Flash-Memory Storage Systems
Autor: | Jen-Wei Hsieh, David Kuang-Hui Yu |
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Rok vydání: | 2022 |
Předmět: | |
Zdroj: | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 41:2863-2876 |
ISSN: | 1937-4151 0278-0070 |
DOI: | 10.1109/tcad.2021.3117508 |
Databáze: | OpenAIRE |
Externí odkaz: |