Differential Evolution Algorithm With Asymmetric Coding for Solving the Reliability Problem of 3D-TLC CT Flash-Memory Storage Systems

Autor: Jen-Wei Hsieh, David Kuang-Hui Yu
Rok vydání: 2022
Předmět:
Zdroj: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 41:2863-2876
ISSN: 1937-4151
0278-0070
DOI: 10.1109/tcad.2021.3117508
Databáze: OpenAIRE