Low temperature growth of high quality CdTe polycrystalline layers
| Autor: | J. Suela, P Motisuke, Sukarno Olavo Ferreira, I. R. B. Ribeiro, J E Oliveira |
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| Rok vydání: | 2007 |
| Předmět: |
Materials science
Acoustics and Ultrasonics Scanning electron microscope Analytical chemistry Condensed Matter Physics Epitaxy Microstructure Surfaces Coatings and Films Electronic Optical and Magnetic Materials law.invention Crystallography law Microscopy Surface roughness Crystallite Electron microscope Thin film |
| Zdroj: | Journal of Physics D: Applied Physics. 40:4610-4613 |
| ISSN: | 1361-6463 0022-3727 |
| DOI: | 10.1088/0022-3727/40/15/037 |
| Popis: | We have investigated the growth of CdTe thin films on glass substrates by hot wall epitaxy. The layers have been characterized by scanning electron microscopy, atomic force microscopy, profilometry, x-ray diffraction and optical transmission. The grown samples are polycrystalline with a high preferential [1 1 1] orientation. Atomic force microscopy and scanning electron microscopy reveal pyramidal grain shapes with a size of around 0.3 µm. The surface roughness increases with sample thickness and growth temperature, reaching about 200 nm for 10 µm thick layers grown at 300 ◦ C. Samples with a thickness of 2 µm grown at 150 ◦ C showed a roughness of less than 40 nm. Optical transmission measurements demonstrate layers with high optical quality. |
| Databáze: | OpenAIRE |
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