Frequency Response Characterization of High-Bandwidth Current Viewing Resistors Used in Dynamic Testing of Power Semiconductors

Autor:	Sergio J. Jimenez, Blake W. Nelson, Austin Curbow, Andrew N. Lemmon, Christopher D. New
Rok vydání:	2023
Zdroj:	2023 IEEE Applied Power Electronics Conference and Exposition (APEC).
DOI:	10.1109/apec43580.2023.10131165
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::4db547413ba5077dfed1c1d85b1a5e73 https://doi.org/10.1109/apec43580.2023.10131165 Zobrazit plný text záznamu