Study on Ellipsometric Spectra of Silicon Nanocrystals

Autor:	张荣君 Zhang Rongjun, 郑玉祥 Zheng Yuxiang, 俞翔 Yu Xiang, 周薇溪 Zhou Weixi, 蔡清元 Cai Qingyuan, 陈良尧 Chen Liangyao, 陆卫杰 Lu Weijie
Rok vydání:	2010
Předmět:	Materials science business.industry Optoelectronics Silicon nanocrystals business Atomic and Molecular Physics and Optics Spectral line Electronic Optical and Magnetic Materials
Zdroj:	Acta Optica Sinica. 30:1891-1894
ISSN:	0253-2239
DOI:	10.3788/aos20103007.1891
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::4d783958fc3914e3120bb2d3386e090c https://doi.org/10.3788/aos20103007.1891 Zobrazit plný text záznamu