Fluorescence x‐ray absorption fine structure measurements using a synchrotron radiation x‐ray microprobe
Autor: | Yohichi Gohshi, Shinjiro Hayakawa, Atsuo Iida, Sadao Aoki, Kohei Sato |
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Rok vydání: | 1991 |
Předmět: | |
Zdroj: | Review of Scientific Instruments. 62:2545-2549 |
ISSN: | 1089-7623 0034-6748 |
Popis: | X‐ray absorption fine structure (XAFS) measurements in regions less than 20 μm in diameter were realized using an x‐ray microprobe employing the fluorescence detection method. To realize an energy tunable intense small x‐ray beam, an ellipsoidal mirror was used as the synchrotron radiation focusing element combined with a double‐crystal monochromator. Distortion of a XAFS spectrum due to the self‐absorption effect is discussed in detail. The degree of the distortion was experimentally evaluated from the measurement of the x‐ray fluorescence intensity as a function of takeoff angle, and the distortion was significantly reduced with the small takeoff angle detection geometry. Utilizing this technique, reliable XAFS spectra were obtained from a rock sample containing several minerals. |
Databáze: | OpenAIRE |
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