Fluorescence x‐ray absorption fine structure measurements using a synchrotron radiation x‐ray microprobe

Autor:	Yohichi Gohshi, Shinjiro Hayakawa, Atsuo Iida, Sadao Aoki, Kohei Sato
Rok vydání:	1991
Předmět:	Microprobe Materials science Extended X-ray absorption fine structure business.industry Synchrotron radiation Fluorescence spectroscopy X-ray absorption fine structure law.invention Optics law Distortion business Absorption (electromagnetic radiation) Instrumentation Monochromator
Zdroj:	Review of Scientific Instruments. 62:2545-2549
ISSN:	1089-7623 0034-6748
Popis:	X‐ray absorption fine structure (XAFS) measurements in regions less than 20 μm in diameter were realized using an x‐ray microprobe employing the fluorescence detection method. To realize an energy tunable intense small x‐ray beam, an ellipsoidal mirror was used as the synchrotron radiation focusing element combined with a double‐crystal monochromator. Distortion of a XAFS spectrum due to the self‐absorption effect is discussed in detail. The degree of the distortion was experimentally evaluated from the measurement of the x‐ray fluorescence intensity as a function of takeoff angle, and the distortion was significantly reduced with the small takeoff angle detection geometry. Utilizing this technique, reliable XAFS spectra were obtained from a rock sample containing several minerals.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::4d6828a0e840262689c8860d9bfdfc45 https://doi.org/10.1063/1.1142228 Zobrazit plný text záznamu