Calibration of the registration metrology systems

Autor: Yulia Korobko, Mahesh Chandramouli
Rok vydání: 2004
Předmět:
Zdroj: SPIE Proceedings.
ISSN: 0277-786X
DOI: 10.1117/12.568245
Popis: Tighter lithography requirements are increasing the challenges for mask registration metrology. Demands on calibration will increase as tool specific calibration need to significantly improve to enable accurate plate quality assessment and adequate matching between multiple writer and metrology system. We present results of calibration study conducted on Leica LMS IPRO 2 and LMS IPRO1. Two different calibration techniques were used to match the tool grid to absolute Cartesian coordinate system. The impact of the two calibration techniques on tool matching is summarized. The results are used to make recommendations on improving calibration methodology.
Databáze: OpenAIRE