Scan chain securization though Open-Circuit Deadlocks

Autor:	Suresh Goyal, Michele Portolan, Bradford Van Treuren
Rok vydání:	2010
Předmět:	business.industry Computer science Design for testing Embedded system Scalability Scan chain System level Parallel computing Deadlock business
Zdroj:	ITC
DOI:	10.1109/test.2010.5699300
Popis:	This paper presents the Open-Circuit Deadlock (OCD), a primitive that allows flexible and scalable securization of a JTAG target, from the cell to the system level.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::4d34fe16f04046eff982e139ddfe8613 https://doi.org/10.1109/test.2010.5699300 Zobrazit plný text záznamu