Noise analysis for intrinsic and external shunted Josephson junctions
| Autor: | Hermann F. Uhlmann, Thomas Ortlepp |
|---|---|
| Rok vydání: | 2004 |
| Předmět: |
Physics
Josephson effect Condensed matter physics Circuit design Metals and Alloys Condensed Matter Physics Noise (electronics) Inductance Condensed Matter::Superconductivity Rapid single flux quantum Logic gate Parasitic element Materials Chemistry Ceramics and Composites Electrical and Electronic Engineering Electronic circuit |
| Zdroj: | Superconductor Science and Technology. 17:S112-S116 |
| ISSN: | 1361-6668 0953-2048 |
| DOI: | 10.1088/0953-2048/17/5/004 |
| Popis: | In the design of electronic applications (for example, rapid single flux quantum (RSFQ) circuits), the properties of Josephson junctions (JJs) provided by technology are the major requirement. The characteristic voltage IcRn an dt he dynamic parameter βc are non-negligibly important, bu tt he external shunted junctions are only completely described by including the parasitic inductance between the junction area and the shunt resistor. The first publications of the RSFQ circuit technique were closely followed by many studies on the dynamic influence of this inductance. It has been pointed out that no practical value of this parameter has to be taken into account in the circuit design and optimization process. The operation of RSFQ logic circuits made of high-temperature superconductors (HTS) are strongly influenced by thermal noise. Our paper contains the determination of the digital bit-error rate for all different types of JJs by using a Fokker–Planck equation for describing the influence of thermal fluctuations. Ou ra nalysis shows that the parasitic inductance cannot be neglected in terms of noise. The intrinsic shunted junctions like high current density-, SINIS- and all kinds of HTS-JJs provide the best noise immunity for a fixed temperature. |
| Databáze: | OpenAIRE |
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