| Autor: |
Jonathan B. Whitlock, Dennis J. Garrity, Jaekyong Cho, Suresh Santhanam, Mark H. Randles, Louis G. Kelly, Theodore R. Maki, John R. Lucas, K. R. Mountfield, William E. Ross, Daniel D. Stancil, David N. Lambeth, James P. Karins, Tan Le |
| Rok vydání: |
1993 |
| Předmět: |
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| Zdroj: |
SPIE Proceedings. |
| ISSN: |
0277-786X |
| Popis: |
This paper is a report on the advanced development and characteristics of a new high resolution, high frame rate, reflected R-MOSLM. This effort is aimed at the production of miniature ruggedized optical correlators (MROC) for optical pattern recognition. Pixel size is under one mil center to center, one third the dimension of present transmission mode devices, thereby reducing the optical path length by an order of magnitude. This development includes optimization of the optical and functional characteristics of the MOSLM for Mil Spec Systems. The device research and process development has been performed at Carnegie Mellon University NSF Data Storage System Center under contract from Litton Data Systems. The Litton Electron Device Division is transitioning the device to production. The MROC system description is described in companion paper (1959-09). |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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