| Autor: |
J.K. Shurtleff, J. Phillips, D.D. Allred, R.T. Perkins, L.V. Knight, J.M. Thorne |
| Rok vydání: |
1992 |
| Zdroj: |
Physics of X-Ray Multilayer Structures. |
| DOI: |
10.1364/pxrayms.1992.pd1 |
| Popis: |
The demand for high quality multilayer x-ray optics (MXOs) has increased as x-ray imaging applications have developed. MXOs must be uniform and smooth with precise periods. The period of the MXO determines the angle and wavelength of the x-ray which can be reflected. Current preparation techniques are limited to a period of approximately 40 Å. To reflect harder x-rays at near normal incidence, smaller periods must be achieved. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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