Noise and transport characterisation of tantalum capacitors
| Autor: | Petr Vasina, Josef Sikula, Munecazu Tacano, Jan Pavelka, Sumihisa Hashiguchi, Vlasta Sedlakova |
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| Rok vydání: | 2002 |
| Předmět: |
Noise temperature
Materials science business.industry Noise spectral density Shot noise Y-factor Johnson–Nyquist noise Condensed Matter Physics Noise (electronics) Atomic and Molecular Physics and Optics Surfaces Coatings and Films Electronic Optical and Magnetic Materials Noise generator Electronic engineering Optoelectronics Flicker noise Electrical and Electronic Engineering Safety Risk Reliability and Quality business |
| Zdroj: | Microelectronics Reliability. 42:841-847 |
| ISSN: | 0026-2714 |
| DOI: | 10.1016/s0026-2714(02)00013-6 |
| Popis: | A low frequency noise and charge carrier transport mechanisms were investigated on tantalum capacitors made by various producers. The model of Ta–Ta2O5–MnO2 MIS structure was used to give physical interpretation of I–V characteristics in normal and reverse modes. The noise in time and frequency domain was examined and noise sources were identified. We evaluated correlation between leakage current and noise spectral density and discussed corresponding quality and reliability indicators. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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