Analysis of Field Degradation Rates Observed in All-India Survey of Photovoltaic Module Reliability 2018
| Autor: | Rajiv Dubey, Sonali Bhaduri, Juzer Vasi, Yogeswara Rao Golive, Birinchi Bora, Narendra Shiradkar, Shashwata Chattopadhyay, Hemant Kumar Singh, Sachin Zachariah, Anil Kottantharayil, A. K. Tripathi, Sanjeev Kumar |
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| Rok vydání: | 2020 |
| Předmět: |
Reliability (semiconductor)
020208 electrical & electronic engineering Photovoltaic system 0202 electrical engineering electronic engineering information engineering Environmental science 02 engineering and technology Electrical and Electronic Engineering Condensed Matter Physics Electronic Optical and Magnetic Materials Degradation (telecommunications) Reliability engineering |
| Zdroj: | IEEE Journal of Photovoltaics. 10:560-567 |
| ISSN: | 2156-3403 2156-3381 |
| DOI: | 10.1109/jphotov.2019.2954777 |
| Popis: | The analysis of performance degradation in photovoltaic (PV) modules with c-Si technologies as observed in the All-India Survey of PV Module Reliability 2018 is presented in this article. The degradation rates are correlated with the module age, system size, mounting configuration, and climate of deployment. Key failure modes responsible for the higher degradation rates seen in certain sites are identified using visual, infrared, and electroluminescence imaging. Potential-induced degradation is found to be the key mechanism responsible for higher degradation rates seen in Young sites. Also, deployment in hot climates and rooftops is seen to accelerate degradation. Multipoint analysis of degradation rates is presented at sites inspected in prior All-India Surveys. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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