Investigating the Degradation of Nb2O5 Thin Films Across 10,000 Lithiation/Delithiation Cycles

Autor:	Xiaoqing Pan, Gaurav Jha, Reginald M. Penner, Vivian T. Chen, Heriberto Flores-Zuleta, Shaopeng Qiao, Chaitanya Gadre, Sheng Dai, Ilektra Andoni, Mingjie Xu, Joshua M. Ziegler
Rok vydání:	2021
Předmět:	Materials science Chemical engineering Materials Chemistry Electrochemistry Energy Engineering and Power Technology Chemical Engineering (miscellaneous) Degradation (geology) Electrical and Electronic Engineering Thin film
Zdroj:	ACS Applied Energy Materials. 4:6542-6552
ISSN:	2574-0962
DOI:	10.1021/acsaem.1c00580
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::4be94f0bc406a9fb5e3a59eecaeb24f7 https://doi.org/10.1021/acsaem.1c00580 Zobrazit plný text záznamu