Speciation at trace levels by helium microwave-induced plasma emission spectrometry

Autor:	Christopher F. Bauer, David F. S. Natusch
Rok vydání:	1981
Předmět:	Trace (semiology) Chemistry Environmental chemistry Genetic algorithm Radiochemistry chemistry.chemical_element Microwave induced plasma Optical emission spectrometry Helium Analytical Chemistry
Zdroj:	Analytical Chemistry. 53:2020-2027
ISSN:	1520-6882 0003-2700
DOI:	10.1021/ac00236a017
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::4bdfad3c08bfdc394546cd5d685abd4b https://doi.org/10.1021/ac00236a017 Zobrazit plný text záznamu