The very high resolution spectrometer at the National Institute of Standards and Technology

Autor:	Hailemichael M. Seyoum, L. R. Hughey, Harry D. Morgan, David C. Humm, Araya Asfaw, John D.E. Fortna, Mitchell L. Furst
Rok vydání:	1994
Předmět:	Physics Nuclear and High Energy Physics Instrument control Spectrometer business.industry Electromagnetic spectrum Resolution (electron density) Synchrotron light source Synchrotron law.invention Optics Data acquisition Beamline law business Instrumentation
Zdroj:	Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 347:287-290
ISSN:	0168-9002
DOI:	10.1016/0168-9002(94)91894-5
Popis:	The Very High Resolution Spectrometer at the Synchrotron Ultraviolet Radiation Facility of the National Institute of Standards and Technology has been upgraded with improved beamline throughput, instrument control and data acquisition. Since this upgrade, a number of high resolution measurements have been made in the vacuum ultraviolet region of the electromagnetic spectrum between 40 nm and 100 nm. Utilizing the features of this instrument, on-line photoelectric recording at intervals of 0.1 pm in first order from a synchrotron light source can be made. A resolution of 0.9 pm has been obtained at 80 nm.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::4bdaac5de7cf88c7057c4bec8fea8d87 https://doi.org/10.1016/0168-9002(94)91894-5 Zobrazit plný text záznamu