Average depths of electron penetration. II. Angular dependence and use to evaluate secondary-electron yield by photons

Autor:	Yu.V. Rogov, V.T. Lazurik, Tatsuo Tabata, Vadim Moskvin
Rok vydání:	1999
Předmět:	Physics Nuclear and High Energy Physics Photon Nuclear Energy and Engineering Secondary emission Cathode ray Photon beams Angle of incidence Penetration (firestop) Electron Electrical and Electronic Engineering Atomic physics Secondary electrons
Zdroj:	IEEE Transactions on Nuclear Science. 46:910-914
ISSN:	1558-1578 0018-9499
Popis:	In our previous paper [V. Lazurik, V. Moskvin and T. Tabata, IEEE Trans. Nucl. Sci. 45, pp. 626-31 (1998)] the average depth of electron penetration, R/sub av/, has been introduced as the average of the maximum depths on the trajectories of electrons passing through a target. In the present work the dependence of R/sub av/ on the angle of incidence of an electron beam has been studied. A semi-empirical equation is derived to calculate R/sub av/ as a function of angle of incidence. We extend the study of R/sub av/ from using it to characterize the average behavior of electron beams in a target to describing the generation of secondary electrons by photon beams. It is shown that R/sub av/ can be used in a wide variety of applications in which the characteristic size of the spatial region of electron production is important.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::4bd2331e2c5999b3e233e2ccae0ce16b https://doi.org/10.1109/23.790702 Zobrazit plný text záznamu