Effect of Aluminum Clad Cu Wire Bonds on Power Cycle Lifetime for High Current Density Power Module Packages

Autor: Fumiyoshi KAWASHIRO, Masaaki YOSHIKAWA, Eitaro MIYAKE, Yoshiki ENDO, Tatsuo TONEDACHI, Hiroshi NISHIKAWA
Rok vydání: 2022
Zdroj: Journal of Smart Processing. 11:71-77
ISSN: 2187-1337
2186-702X
DOI: 10.7791/jspmee.11.71
Databáze: OpenAIRE