Stacking faults in Co-alloy longitudinal media

Autor:	B. Lu, Jie Zou, D.E. Laughlin, D.N. Lambeth
Rok vydání:	2000
Předmět:	Nial Materials science Alloy Stacking engineering.material Epitaxy Electronic Optical and Magnetic Materials Electron diffraction Lattice (order) engineering Electrical and Electronic Engineering Composite material Thin film computer Stacking fault computer.programming_language
Zdroj:	IEEE Transactions on Magnetics. 36:2357-2359
ISSN:	0018-9464
DOI:	10.1109/20.908429
Popis:	Stacking faults in CoCrTa/Cr, CoCrPt/NiAl, and CoCrPt/Cr/NiAl films have been studied by electron diffraction. Interfacial lattice match and epitaxial growth play important roles in reducing the stacking fault density. It is found that the bicrystal media has large stacking fault densities. In the unicrystal media case, when good epitaxy between magnetic layer and underlayer cannot be achieved, there are mainly randomly oriented grains in the magnetic layer. These random grains have a high stacking fault density.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::4bc3cc3595296d9734b8af8374698955 https://doi.org/10.1109/20.908429 Zobrazit plný text záznamu