Measurement method of microwave surface resistance of high Tc superconductive thin films
| Autor: | Zheng-xiang Luo, Qishao Zhang, Yingmin Zhang, Kai Yang |
|---|---|
| Rok vydání: | 2003 |
| Předmět: |
Materials science
business.industry Q value System of measurement Energy Engineering and Power Technology Condensed Matter Physics Electronic Optical and Magnetic Materials Resonator Q factor Sapphire Optoelectronics Electrical and Electronic Engineering Thin film business Sensitivity (electronics) Sheet resistance |
| Zdroj: | Physica C: Superconductivity. 385:473-476 |
| ISSN: | 0921-4534 |
| DOI: | 10.1016/s0921-4534(02)02065-8 |
| Popis: | A measurement system for characterization of microwave surface resistance of HTS thin films is presented. In this system, a high Q factor sapphire resonator probe with TE 011+ δ mode was developed to measure the surface resistance R S of a single piece of HTS thin film at 12 GHz and 77 K. The size of HTS films can be equal to about 2 in. The method has advantages of nondestructivity, single sample, high Q value, high sensitivity, convenient experiment setup, small volume, and flexibility in operation. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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