Combined ellipsometry and X-ray related techniques for studies of ultrathin organic nanocomposite films
| Autor: | Katy Roodenko, Jörg Rappich, Alex von Bohlen, Karsten Hinrichs, Roland Hergenröder, Norbert Esser, Beatrix Pollakowski, Markus Krämer |
|---|---|
| Rok vydání: | 2010 |
| Předmět: |
Nanocomposite
Materials science Silicon Metals and Alloys X-ray standing waves Analytical chemistry chemistry.chemical_element Surfaces and Interfaces Evaporation (deposition) Surfaces Coatings and Films Electronic Optical and Magnetic Materials X-ray reflectivity Nitrobenzene chemistry.chemical_compound chemistry Ellipsometry Materials Chemistry Thin film |
| Zdroj: | Thin Solid Films. 518:5509-5514 |
| ISSN: | 0040-6090 |
| Popis: | Ultrathin nanocomposite films of nitrobenzene on silicon were analyzed by Infrared Spectroscopic Ellipsometry (IRSE), X-ray reflectivity (XRR) and X-ray standing waves (XSW) before and after evaporation of gold. Infrared Spectroscopic Ellipsometry measurements were performed for identification of adsorbates and for investigation of the molecular orientation. Results for film thickness were correlated with XRR measurements. Further, XSW measurements of elements incorporated in nitrobenzene (C, N, and O) were performed with soft X-rays. The combination of the different methods allowed to confirm a model for the electrochemically deposited nitrobenzene films before and after gold evaporation. The characterization by XRR and XSW scans using hard X-rays showed that gold had penetrated into the nitrobenzene film and thus changed density and optical properties of this layer significantly. A depth profile correlated to the electron density is deduced from the XRR measurements. This profile allows to localize—in vertical direction—gold islands within the composite film. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|
Full Text from ScienceDirect