From Atoms to Functional Nanomaterials: Structural Modifications as Observed Using Aberration-Corrected STEM
Autor: | Steven A. Bradley, G. J. Gajda, S. I. Sanchez, Y. Le, M. T. Schaal, P.L. Bogdan, S. M. Tonnesen, Lawrence F. Allard |
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Rok vydání: | 2018 |
Předmět: | |
Zdroj: | Microscopy Today. 26:24-31 |
ISSN: | 2150-3583 1551-9295 |
DOI: | 10.1017/s1551929518000469 |
Popis: | Aberration-corrected STEM has become a standard analytical technique in the field of nanoscience. As “designer materials” have become more in demand in academic circles, verification of a desired product makes atomic-resolutionanalysis mandatory. Industry currently faces the same trend where tailor-made materials are customized for a given application. Here we show several examples where quantifiable atomic-scale manipulation of nanomaterials can have a dramatic impact on structure and, by extension, functionality. |
Databáze: | OpenAIRE |
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