Dependence of damage efficiency of ions in diamond on electronic stopping

Autor:	G. Myburg, E. Friedland, H. D. Carstanjen, M.A. Nasr
Rok vydání:	2005
Předmět:	Nuclear and High Energy Physics Argon Materials science Physics::Instrumentation and Detectors Forward scatter Annealing (metallurgy) Detector Diamond chemistry.chemical_element engineering.material Ion chemistry engineering Irradiation Atomic physics Electrostatic analyzer Instrumentation
Zdroj:	Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 230:129-135
ISSN:	0168-583X
DOI:	10.1016/j.nimb.2004.12.030
Popis:	Natural diamond single crystals were irradiated at room temperature with 75 keV carbon and 80 keV argon ions at fluences exceeding the graphitization dose. The resulting damage depth profiles before and after rapid annealing at 1500 K were obtained by α-particle channeling analysis. Measurements were done both at back- and forward scattering angles using conventional surface barrier detectors and an electrostatic analyzer system, respectively. Boundary positions of the graphitic layers were determined and compared with the corresponding depth-dependent elastic and inelastic energy deposition graphs to extract critical damage energy densities. The obtained values increase strongly with inelastic energy deposition rate, indicating a significant reduction of the ions’ damage efficiency due to irradiation induced annealing by electronic stopping.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::4b3404e483f1ba2b1c668a93c40ea4d4 https://doi.org/10.1016/j.nimb.2004.12.030 Zobrazit plný text záznamu Full Text from ScienceDirect