Optimisation and applications of the Cambridge University 600 kV high resolution electron microscope

Autor:	R. A. Camps, W. O. Saxton, L. A. Freeman, J. R. A. Cleaver, A.E. Timbs, David J. Smith, C. J. D. Catto, W. C. Nixon, V. E. Cosslett, H. Ahmed, K.C.A. Smith
Rok vydání:	1982
Předmět:	Materials science business.industry High resolution Nanotechnology Atomic and Molecular Physics and Optics High resolution electron microscope Electronic Optical and Magnetic Materials law.invention Optics Atomic resolution law Electron microscope business Instrumentation Image resolution
Zdroj:	Ultramicroscopy. 9:203-213
ISSN:	0304-3991
DOI:	10.1016/0304-3991(82)90201-7
Popis:	The Cambridge University 600 kV high resolution electron microscope is currently operating with a directly interpretable image resolution of close to 2 A. Following a brief outline of salient features of this HREM which have proven crucial to optimising its performance, details are given of methods whereby such high resolution levels are now obtainable on a routine basis. Some recent applications are also described. The success of these studies confirms that electron microscopy at the atomic resolution level will have an increasing impact in many areas of materials research.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::4b0909f4951cbc95d9db5a7739b9f92d https://doi.org/10.1016/0304-3991(82)90201-7 Zobrazit plný text záznamu