XPS and magneto-transport studies on the surface of CdHgTe
| Autor: | Tsunemasa Taguchi, Akio Hiraki, Toshifumi Kawano |
|---|---|
| Rok vydání: | 1985 |
| Předmět: |
chemistry.chemical_classification
X-ray spectroscopy Argon Solid-state physics Sulfide Photoemission spectroscopy Analytical chemistry Oxide chemistry.chemical_element Condensed Matter Physics Anode Inorganic Chemistry chemistry.chemical_compound chemistry X-ray photoelectron spectroscopy Materials Chemistry |
| Zdroj: | Journal of Crystal Growth. 72:432-436 |
| ISSN: | 0022-0248 |
| DOI: | 10.1016/0022-0248(85)90186-1 |
| Popis: | X-ray photoemission spectroscopy (XPS) measurements linked with an argon ion sputtering technique have been performed to characterize surface chemical and physical properties of p-type Cd 0.25 Hg 0.75 Te. The results acquired under dry oxidation conditions suggest that the production of Hg vacancies and Cd migration play an important role for the oxidation process, and CdTeO 3 is considered to be a major constituent on the oxide surfaces. Transverse magneto-resistance measurement was made of p-type samples with anodic films at 4.2 K up to 5 T. Shubnikov-De Haas oscillation was observed in the samples with anodic oxide film, but not in the case with anodic sulfide film. The effect of the interface on the magneto-transport properties is discussed. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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