Machine Learning for Optical Layer Failure Management

Autor: Danshi Wang, Dongdong Wang, Min Zhang, Chunyu Zhang, Songlin Liu, Lingling Wang
Rok vydání: 2021
Předmět:
Zdroj: 26th Optoelectronics and Communications Conference.
DOI: 10.1364/oecc.2021.t3a.3
Popis: We review applications of machine learning (ML) in optical layer failure management, including alarm analysis, failure prediction, failure detection, failure diagnosis, and failure location driven by various algorithms from ML communities.
Databáze: OpenAIRE