Breakdown and Self-healing in Tantalum Capacitors
| Autor: | Alexander Teverovsky |
|---|---|
| Rok vydání: | 2021 |
| Předmět: |
010302 applied physics
Tantalum capacitor Materials science Tantalum chemistry.chemical_element Dielectric 01 natural sciences Cathode law.invention Capacitor Thermal conductivity chemistry law 0103 physical sciences Electrical and Electronic Engineering Composite material Electrical conductor Leakage (electronics) |
| Zdroj: | IEEE Transactions on Dielectrics and Electrical Insulation. 28:663-671 |
| ISSN: | 1558-4135 1070-9878 |
| Popis: | In this work, different types of polymer and MnO 2 cathode capacitors are tested for scintillation breakdown using a constant current stress (CCS) technique modified to allow detection of amplitudes and duration of current spikes. Monitoring of leakage currents with time under bias is used to assess the effect of scintillations. The appearance and composition of damaged sites are examined after deprocessing and cross-sectioning. Thermal processes during scintillations are analyzed, a mechanism of breakdown based on growth of conductive filaments in the dielectric is suggested, and self-healing processes in polymer and MnO 2 cathode capacitors is discussed. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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