Off-stoichiometry indexation of BiFeO 3 thin film on silicon by Rutherford backscattering spectrometry
| Autor: | Wei Xie, Dejun Fu, Neena Devi, Changwei Zou, Shu-Wen Xue, Canxin Tian, RenZheng Xiao, Wang Zesong, Gui-Ang Liu |
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| Rok vydání: | 2018 |
| Předmět: |
Materials science
Silicon Analytical chemistry General Physics and Astronomy chemistry.chemical_element 02 engineering and technology 021001 nanoscience & nanotechnology Rutherford backscattering spectrometry 01 natural sciences chemistry 0103 physical sciences Thin film 010306 general physics 0210 nano-technology Stoichiometry |
| Zdroj: | Chinese Physics B. 27:047901 |
| ISSN: | 1674-1056 |
| DOI: | 10.1088/1674-1056/27/4/047901 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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