Characterization of Electromechanical Delamination Behaviors in Practical REBCO Coated Conductor Tapes Under Transverse Tension at 77 K

Autor:	Mark Angelo Diaz, Hyung-Seop Shin
Rok vydání:	2023
Předmět:	Electrical and Electronic Engineering Condensed Matter Physics Electronic Optical and Magnetic Materials
Zdroj:	IEEE Transactions on Applied Superconductivity. 33:1-5
ISSN:	2378-7074 1051-8223
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::4a84ea64f93f63f574be18e7102e4db8 https://doi.org/10.1109/tasc.2023.3242213 Zobrazit plný text záznamu