Radiation characterisation for new tantalum polymer capacitors
| Autor: | D. Lacombe, I. Lopez-Calle, P. Martin, E. Munoz, Yolanda Morilla, M. Dominguez, C. Mota, M. Morales, D. Nunez, J. Pedroso |
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| Rok vydání: | 2016 |
| Předmět: |
Electrolytic capacitor
Tantalum capacitor Materials science business.industry Tantalum chemistry.chemical_element Hardware_PERFORMANCEANDRELIABILITY Filter capacitor Polymer capacitor law.invention Capacitor Film capacitor chemistry Hardware_GENERAL law Hardware_INTEGRATEDCIRCUITS Electronic engineering Optoelectronics Breakdown voltage business |
| Zdroj: | 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS). |
| DOI: | 10.1109/radecs.2016.8093218 |
| Popis: | Polymer tantalum capacitor technology was developed in response to demands from the market to lower the ESR of tantalum capacitors while preserving their small case size and high reliability. The technology is promising in several aspects. The higher quality interface between the dielectric and the polymer cathode increases the breakdown voltage of the device, as well as reducing its DC leakage current, even at extreme radiation exposure conditions. |
| Databáze: | OpenAIRE |
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