| Autor: |
W.C. Pflanzi, E. Seebacher, Z. Huszka |
| Rok vydání: |
2006 |
| Předmět: |
|
| Zdroj: |
Proceedings of the International Conference Mixed Design of Integrated Circuits and System, 2006. MIXDES 2006.. |
| DOI: |
10.1109/mixdes.2006.1706551 |
| Popis: |
This paper presents a new accurate method for generation of 1/f noise worst cases (WC) based on statistical measurement data. This is implemented in existing state of the art design simulators with a scaled flicker noise model for CMOS. Verification is shown on a noise sensitive analog circuitry as a benchmark for robust flicker noise design. The methodology presented can easily be extended to other devices like BJTs or any other |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
|
