Opportunities and challenges of the 450mm transition

Autor: Yu-Chih Wang, Wenli Collison, Frank Robertson, Paul Farrar, Christopher L. Borst, K. K. W. Lee, Rand Cottle, Greg Akiki, Mark Kelling, Wen-Yu Ku, Lin Pinyen, Sangdong Kwon, David Skilbred, John Lin, Stock Chang
Rok vydání: 2013
Předmět:
Zdroj: 2013 IEEE International Electron Devices Meeting.
DOI: 10.1109/iedm.2013.6724626
Popis: A close collaboration among IC makers, equipment and material suppliers, facility, and automation providers resulted in better alignment in the technology roadmap and lower development costs for tools and wafers. This would enable the cost-effective operation of future 450mm HVM fabs. The 450mm transition will certainly create another prosperous opportunity for the semiconductor industry.
Databáze: OpenAIRE