Nanostructure investigations with the analytical transmission electron microscope

Autor:	Reinhold Rennekamp, Jürgen Thomas, Hans-Dietrich Bauer
Rok vydání:	1998
Předmět:	Diffraction Nanostructure Materials science Electron diffraction Transmission electron microscopy Electron energy loss spectroscopy Analytical chemistry Spectroscopy Microstructure Biochemistry Nanocrystalline material
Zdroj:	Fresenius' Journal of Analytical Chemistry. 361:515-521
ISSN:	1432-1130 0937-0633
DOI:	10.1007/s002160050938
Popis:	Concerning the conventional TEM-imaging as well as the analytical procedures the capabilities are pointed out: electron diffraction, energy dispersive X-ray spectroscopy (EDXS) and electron energy loss spectroscopy (EELS). The possibilities of investigation of both nanocrystalline materials and multilayers are discussed, accompanied by examples of current investigations: At alloys, produced by intense milling, at single nanocrystals the imaging by diffraction contrast was successful, the analysis has failed because of the sample thickness. By means of energy spectroscopic imaging multilayers from Fe-SiB/NbCu and Fe/Cr as well as Al2O3/TiN have been characterized.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::49be51e50f2c00b3fc5936ffc0a35e7d https://doi.org/10.1007/s002160050938 Zobrazit plný text záznamu Full text from SpringerLink