X-ray-induced degradation of OEG-terminated SAMs on silica surfaces during XPS characterization
| Autor: | Yann Chevolot, Eliane Souteyrand, Geneviève Grenet, Thomas Gehin, Anaïs Garnier, Djawhar Ferrah, Jean-Pierre Cloarec, Francisco Palazon, Claude Botella |
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| Rok vydání: | 2015 |
| Předmět: |
Materials science
X-ray Ether 02 engineering and technology Surfaces and Interfaces General Chemistry 010402 general chemistry 021001 nanoscience & nanotechnology Condensed Matter Physics 01 natural sciences Fluorescence 0104 chemical sciences Surfaces Coatings and Films chemistry.chemical_compound Adsorption chemistry X-ray photoelectron spectroscopy Chemical engineering Polymer chemistry Materials Chemistry Degradation (geology) 0210 nano-technology Ethylene glycol Biosensor |
| Zdroj: | Surface and Interface Analysis. 47:719-722 |
| ISSN: | 0142-2421 |
| Popis: | Oligo ethylene glycol layers are widely used in biosensor applications, mainly for their anti-fouling abilities. Such surfaces are often characterized by X-ray photoelectron spectroscopy (XPS) as this method allows a precise determination of the surface chemical composition. We show herein that X-rays used during XPS characterization quickly and significantly degrade oligo ethylene glycol immobilized onto silica substrates. It is therefore necessary to introduce a correcting factor to assess the true (i.e. without degradation) corresponding ether contribution in the XPS spectrum of such organic layers. Eventually, fluorescence scans show the loss of anti-fouling properties of the degraded surface, leading to greater amounts of adsorbed (fluorescently labeled) protein. Copyright © 2015 John Wiley & Sons, Ltd. |
| Databáze: | OpenAIRE |
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