| Autor: |
Sateesh Nalliboena, Chandra Prakash Vudatha, Sastry K. R. Jammalamadaka, Bala Krishna Kamesh Duvvuri, L. S. S. Reddy |
| Rok vydání: |
2011 |
| Předmět: |
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| Zdroj: |
2011 2nd National Conference on Emerging Trends and Applications in Computer Science. |
| DOI: |
10.1109/ncetacs.2011.5751411 |
| Popis: |
A primary issue in black-box testing is how to generate adequate test cases from input domain of the system under test on the basis of user's requirement specification. However, for some types of systems including embedded systems, developing test cases from output domain is more suitable than developing from input domain, especially, when the output domain is smaller. Exhaustive testing of the embedded systems in the critical regions is important as the embedded systems must be basically fail safe systems. The Critical regions of the input space of the embedded systems can be pre-identified and supplied as seeds. In this paper, the authors presents an Automated Test Case Generator (ATCG) that uses Genetic algorithms (GAs) to automate the generation of test cases from output domain and the criticality regions of an embedded System. The approach is applied to a pilot project ‘Temperature monitoring and controlling of Nuclear Reactor System’ (TMCNRS) which is an embedded system developed using modified Cleanroom Software Engineering methodology. The ATCG generates test cases which are useful to conduct pseudo-exhaustive testing to detect single, double and several multimode faults in the system. The generator considers most of the combinations of outputs, and finds the corresponding inputs while optimizing the number of test cases generated. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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