Scribing into hydrogenated diamond surfaces using atomic force microscopy
| Autor: | Martin Stutzmann, Jose A. Garrido, C. Sauerer, Philippe Bergonzo, Bohuslav Rezek, Christoph E. Nebel, E. Snidero |
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| Rok vydání: | 2003 |
| Předmět: |
Kelvin probe force microscope
Materials science Physics and Astronomy (miscellaneous) Silicon business.industry Material properties of diamond Analytical chemistry chemistry.chemical_element Diamond Conductive atomic force microscopy engineering.material Surface conductivity chemistry Electron affinity engineering Optoelectronics Work function business |
| Zdroj: | Applied Physics Letters. 82:3336-3338 |
| ISSN: | 1077-3118 0003-6951 |
| DOI: | 10.1063/1.1576507 |
| Popis: | Atomic force microscopy (AFM) is applied to control surface termination of hydrogenated diamond surfaces with lateral resolution of ≈10 nm. Using negatively biased silicon cantilevers, microscopic patterns can be scribed into a diamond surface, up to a depth of 3 nm. The inscribed patterns exhibit different electronic properties to the rest of the surface, namely electron affinity and conductivity. The effect of contact and noncontact AFM on the pattern appearance is discussed. |
| Databáze: | OpenAIRE |
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