Spectrophotometric differential kinetic method for the determination of germanium and silicon in the presence of each other in the GeO2–SiO2 systems
| Autor: | O. V. Rakhimova, M. P. Syomov, V. I. Rakhimov, V. A. Bayanov |
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| Rok vydání: | 2016 |
| Předmět: |
010302 applied physics
Silicon Kinetic scheme Analytical chemistry chemistry.chemical_element Germanium 010402 general chemistry Condensed Matter Physics Kinetic energy 01 natural sciences 0104 chemical sciences chemistry 0103 physical sciences Materials Chemistry Ceramics and Composites Limit (mathematics) Differential (mathematics) |
| Zdroj: | Glass Physics and Chemistry. 42:214-217 |
| ISSN: | 1608-313X 1087-6596 |
| DOI: | 10.1134/s1087659616020036 |
| Popis: | The spectrophotometric differential kinetic method of determination of silicon and germanium based on a difference in the kinetic parameters in the presence of each other the same analytical form in GeO2–SiO2 systems is described. The possibility of the development of analytical techniques taking into account the revealed limitations of the proposed kinetic scheme is shown. The studies of the model solutions show that the margin of analytical error does not exceed the acceptable limit for the applied method. |
| Databáze: | OpenAIRE |
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