Neon-FIB for the Fabrication of Tips for Atom Probe Tomography and Electron Tomography

Autor:	Paul T. Blanchard, Andrew M. Minor, Deying Xia, Frances I. Allen, Ruopeng Zhang, John A. Notte, Norman A. Sanford
Rok vydání:	2020
Předmět:	Neon Materials science Fabrication Electron tomography chemistry business.industry law Optoelectronics chemistry.chemical_element Atom probe business Instrumentation law.invention
Zdroj:	Microscopy and Microanalysis. 26:184-184
ISSN:	1435-8115 1431-9276
DOI:	10.1017/s1431927620013719
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::48f54123e748e029e5e34ae2fa9f7c7d https://doi.org/10.1017/s1431927620013719 Zobrazit plný text záznamu