Structural-phase state and electrophysical properties of Ru thin films

Autor: M. V. Kostenko, I. V. Cheshko, Serhii Ivanovych Protsenko, A. M. Lohvynov
Rok vydání: 2016
Předmět:
Zdroj: 2016 International Conference on Nanomaterials: Application & Properties (NAP).
Popis: The paper shows the results of the study structural-phase state and electrical properties of Ru nanocrystalline films. It was found that the film thickness and substrate temperature greatly affects on the crystal structure of these nanostructures. At thickness d 50 nm and heating the substrate upon receipt of 600 K and subsequent annealing to 900 K formed polycrystalline hexagonal structure with an average crystallite size of 15 nm. Lattice parameters close to the table values for bulk samples and ρ = (2−4)·10−6 Ω·m.
Databáze: OpenAIRE