The influence of growth temperature on the structural characteristics of YBa2Cu3O7- deltafilms: a Raman scattering study
| Autor: | V. Yu. Davydov, A B Sherman, M. V. Belousov |
|---|---|
| Rok vydání: | 1993 |
| Předmět: |
Delta
Materials science Metals and Alloys Crystal orientation Analytical chemistry Crystal growth Substrate (electronics) Condensed Matter Physics symbols.namesake Cavity magnetron Materials Chemistry Ceramics and Composites symbols Electrical and Electronic Engineering Thin film Raman spectroscopy Raman scattering |
| Zdroj: | Superconductor Science and Technology. 6:819-821 |
| ISSN: | 1361-6668 0953-2048 |
| Popis: | Orientation of YBa2Cu3O7- delta films at the surface and at the film-(100) MgO substrate interface for various growth temperatures Ts have been studied using Raman scattering. On the film-substrate interface the films were c-oriented for Ts>670 degrees C and a-oriented for lower growth temperatures. Films grown at Ts approximately=670 degrees C to a thickness >0.2 mu m contained a transition from the c- to the a-orientation near the surface. A possible mechanism for the influence of growth temperature on the YBa2Cu3O7- delta film orientation is discussed. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|