| Autor: |
Anatoly A. Pavlenko, N. V. Korchikova, Gennady Tolmachev, S. V. Kara-Murza, Alexandr Tikhii |
| Rok vydání: |
2019 |
| Předmět: |
|
| Zdroj: |
Springer Proceedings in Physics ISBN: 9783030198930 |
| DOI: |
10.1007/978-3-030-19894-7_22 |
| Popis: |
The results of X-ray diffraction analysis, spectrophotometry, ellipsometry of thin films of the ferroelectric-relaxor Ba0.5Sr0.5Nb2O6 (SBN-50) deposited on Al2O3 (001) and MgO (001) crystal substrates are presented. It is established that the natural direction of film growth coincides with the direction of the optical axis in uniaxial crystals [001]. A method for determining optical parameters (the refractive index and the thickness of a film material, as well as the disturbed surface layers) of transparent films on transparent substrates by combination of the ellipsometric methods and spectrophotometric measurements is described. The results of calculations of the parameters of the films are present. It is shown that the values of the refractive indices \( n_{0} \) and \( n_{\text{e}} \) SBN-films do not differ from the crystal ones. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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