Formation of an interfacial MoSe2 layer in CVD grown CuGaSe2 based thin film solar cells
| Autor: | A. Rumberg, Th. Schedel-Niedrig, Peter Schubert-Bischoff, D. Fuertes Marrón, Ulrike Bloeck, R. Würz, M.Ch. Lux-Steiner, S.M. Babu, A. Meeder |
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| Rok vydání: | 2003 |
| Předmět: |
Materials science
Metals and Alloys Mineralogy Heterojunction Surfaces and Interfaces Substrate (electronics) Chemical vapor deposition Surfaces Coatings and Films Electronic Optical and Magnetic Materials law.invention Chemical engineering law Solar cell Materials Chemistry Crystallite High-resolution transmission electron microscopy Ohmic contact Layer (electronics) |
| Zdroj: | Thin Solid Films. :398-402 |
| ISSN: | 0040-6090 |
| DOI: | 10.1016/s0040-6090(03)00261-x |
| Popis: | Thin polycrystalline films of CuGaSe 2 (CGSe) have been grown on Mo coated glass substrates by halogen supported chemical vapor deposition (CVD) with two different binary source materials, Cu 2 Se and Ga 2 Se 3 . Solar cells based on these absorber films prepared in a sequential two-stage process show efficiencies exceeding 6%. High resolution transmission electron microscopy investigation of the complete solar cell structure reveals a 170-nm thick MoSe 2 interfacial layer at the CGSe/Mo back contact. The crystallites of the MoSe 2 layered structure are found to be mainly oriented perpendicular to the Mo surface. The main focus of this investigation was to study the influence of the CVD process on the growth of MoSe 2 and the role the interfacial layer may have in the performance of the solar cell. For a detailed analysis we studied the growth and morphology of the interfacial layer dependent on the [Cu]/[Ga]-ratio in the gas phase during the CGSe deposition process and the Na content of the glass substrate. It was found that Na influences the growth of the MoSe 2 layer. By means of temperature dependent IV (IVT)-measurements the electrical properties of the CGSe/MoSe 2 /Mo heterostructure were investigated. In the heterostructure under investigation the MoSe 2 interfacial layer mediates an ohmic contact to the CGSe film. |
| Databáze: | OpenAIRE |
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