Pulsed laser deposition and ferroelectric characterization of bismuth titanate films
| Autor: | S. Sinharoy, Donald R. Lampe, H. Buhay, M. H. Francombe, E. Stepke, W. H. Kasner |
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| Rok vydání: | 1991 |
| Předmět: |
Materials science
Physics and Astronomy (miscellaneous) Excimer laser business.industry Bismuth titanate medicine.medical_treatment Inorganic chemistry Chemical vapor deposition Dielectric Ferroelectricity Titanate Pulsed laser deposition chemistry.chemical_compound chemistry medicine Optoelectronics business Polarization (electrochemistry) |
| Zdroj: | Applied Physics Letters. 58:1470-1472 |
| ISSN: | 1077-3118 0003-6951 |
| DOI: | 10.1063/1.105200 |
| Popis: | Stoichiometric films of bismuth titanate, Bi4Ti3O12, have been grown for the first time by the technique of pulsed excimer laser deposition. Ferroelectric films were obtained at temperatures as low as 500 °C on Si(100), MgO(110), and Pt‐coated Si(100) substrates. Hysteresis measurements using a Pt‐coated Si sample yielded a saturation polarization value of about 28 μC/cm2, consistent with a randomly oriented titanate film structure. A preliminary metal‐insulator‐semiconductor sandwich structure of the form Bi4Ti3O12‐CaF2(100 A)‐Si was grown and used to examine polarization induced memory switching effects. |
| Databáze: | OpenAIRE |
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