Autor: |
Ningsheng Xu, S.Z. Deng, Zhangxu Pan, J.C. She |
Rok vydání: |
2014 |
Předmět: |
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Zdroj: |
2014 27th International Vacuum Nanoelectronics Conference (IVNC). |
Popis: |
We report a featured device structure of Si tip with ultra-narrow nanoscale charge transfer channel. The nano-channel, as a resistance, was integrated with individual tips to form the hourglass-like structures. Two-terminal current-voltage tests were performed. The result shows that 10-nm-difference in diameter (70 to 80 nm) of the nano-channel can cause a resistance change of two order in magnitude. We propose that the electronegative nano-channel surface with dangling bonds (surface state) may take the account for the effect. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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