Experimental and numerical investigation of two mechanisms underlying runaway electron beam formation

Autor:	E. Kh. Baksht, V. A. Shklyaev, Alexander G. Burachenko, Victor F. Tarasenko, S. Ya. Belomyttsev, V. V. Ryzhov
Rok vydání:	2012
Předmět:	Materials science Physics and Astronomy (miscellaneous) law Ionization Electric field Cathode ray Electrical breakdown Electron Atomic physics Cathode Anode law.invention Diode
Zdroj:	Technical Physics. 57:998-1002
ISSN:	1090-6525 1063-7842
DOI:	10.1134/s1063784212070031
Popis:	The electrical breakdown of a gas-filled diode with a highly nonuniform electric field is studied in the case when a 25-kV voltage pulse generates runaway electron beams with time-separated maxima of different duration behind anode foil. Experimental data are analyzed and numerically simulated using the PIC/MC code OOPIC-Pro. It is shown that, in terms of the model used, both beams arise at the cathode but their formation mechanisms differ. The first runaway electron beam no longer than 500 ps is attributed to the ionization mechanism; the second one, which may last several nanoseconds, is due to emission.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::482d8ade3bdbeac9aa9bd65328d3d154 https://doi.org/10.1134/s1063784212070031 Zobrazit plný text záznamu Plný text ve formátu PDF