Autor:	Joe W. McPherson
Rok vydání:	2013
Předmět:	Bathtub curve Computer science Warranty Liability Breakdown strength Failure rate Accelerated failure time model Reliability engineering
Zdroj:	Reliability Physics and Engineering ISBN: 9783319001210
DOI:	10.1007/978-3-319-00122-7_7
Popis:	For a collection of devices, it is critically important to be able to understand the expected failure rate for the devices. For the supplier of such devices, the expected failure rate will be an important indicator of future warranty liability. For the customer, the expected failure rate will be an important indicator of future satisfaction. For mission-critical applications, it is of paramount importance for one to know that the expected failure rate will be extremely low.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::4801fec1ef338d49f033bb4d54dca12c https://doi.org/10.1007/978-3-319-00122-7_7 Zobrazit plný text záznamu