Impact of Variant Gate Insulator Fabrication Process on Reliability of Dual-Gate InGaZnO Thin-Film Transistors

Autor:	Ya-Ting Chien, Kuan-Ju Zhou, Mao-Chou Tai, Yu-An Chen, Pei-Jun Sun, Ya-Huan Lee, Ting-Chang Chang, Tsung-Ming Tsai, Yang-Shun Fan, Chen-Shuo Huang, Kuo-Kuang Chen, Chih-Hung Tsai
Rok vydání:	2023
Předmět:	Electrical and Electronic Engineering Electronic Optical and Magnetic Materials
Zdroj:	IEEE Transactions on Electron Devices. 70:1089-1094
ISSN:	1557-9646 0018-9383
DOI:	10.1109/ted.2023.3237506
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::47e9fec6a491fdf20a8d5d89fdc94949 https://doi.org/10.1109/ted.2023.3237506 Zobrazit plný text záznamu