Developing a cost-efficient dual sampling system for lot disposition by considering process yield and quality loss

Autor:	Shih-Wen Liu, Zih-Huei Wang, To-Cheng Wang
Rok vydání:	2022
Předmět:	Safety Risk Reliability and Quality Industrial and Manufacturing Engineering
Zdroj:	Quality Engineering. 35:267-278
ISSN:	1532-4222 0898-2112
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::47ad2a32e220a0e115524b17f8c6d4cf https://doi.org/10.1080/08982112.2022.2124381 Zobrazit plný text záznamu